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Application scenario: Applied to inspect open/short circuit defection of micron circuit in array manufacturing process of display panel
Product features
– Applicable for TFT-LCD, LTPS, OLED
– Gate / Cs / Data open / short / Cross short defects can be inspected
– Real-time online inspection
– Modular design, standardized CIM communication software
– Multi-axis high precision motion control technology
– Completely non-contact inspection technology
Core Technology
– Completely non-contact inspection technology
– High precision motion control technology
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- About Us
- Company Profile
- Development History
- Company Honor
- Technology Advantage
- Sustainable development
- Main Products
- Pan-semiconductor Transfer Equipment
- Pan-semiconductor Process Equipment
- Pan-semiconductor Inspection Equipment
- Industrial Software And Big Data
- Core Components
- Contact us
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Telephone：0551-68122312
Sales Email：sales@sineva.com.cn
HR Email：hfzp@sineva.com.cn
Address：
Between Southwest of Longzihu Rd and Jingshan Rd, Xinzhan Zone, Hefei, Anhui, 230012, China
Block 10JDB Tech Park No.18 Kechuang 10th Street BDA Beijing 100176, China
Copyright © Hefei Sineva Intelligent Machine Co.,Ltd Disclaimer Anhui ICP No.14018951 Business License
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Disclaimer Anhui ICP No.14018951
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