Line Scan Type Mapping Sensor

Application: Widely used in Pan-semiconductor production lines such as FPD to detect the array distribution of materials in the cassette


Product features



– Fully independent development, master a number of core technologies

– Multiple sets of parameter configurations are supported, and the same set of products can be applied to different sizes glass substrates

– Customized according to cassette specifications to meet the diverse needs of users

Core Technology



– Infrared photoelectric detection technology

– Communication bus interface technology

– Image recognition and detection algorithm for glass substrate



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